ART-Fi Presents, “Faster Terminal Antenna Design & Certification with SAR Screening”
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Overview: Your path to SAR compliance just got easier.With an eye toward the future of SAR testing and antenna design, Benoit Derat, research engineer and President of Art-Fi field imaging, outlines a new “screening method” for SAR testing using modern vector probe array SAR testing technology that is meant to deal with the challenges designers and mobile R&D departments face, including LTE, WCDMA, GSM, dynamic antenna tuning, and of course FCC and IEC regulations.When legacy robotic SAR measurement systems were introduced, cutting edge mobile phones featured 1 or 2 GSM or CDMA transmission bands. Robotic SAR measurement for certifications took about 20 minutes per measurement, which was sufficient to complete testing in a day or two with a single SAR testing system. R&D SAR testing was in a similar boat, with testing being adequate for each hardware or antenna pattern change. This is no longer the case: meet the challenge with vector probe array technology and SAR screening.
Speaker: Benoît Derat
Benoît Derat was born in France in 1979. He received the electrical engineering degree from SUPELEC, Gif-sur-Yvette, France and the PhD degree in physics from University of Paris XI (Orsay, France). He served as an expert in antenna design, numerical modeling and SAR measurement for SAGEM Mobiles from 2002 to 2008. Having co-authored over 70 scientific contributions and filed 4 patents relating to SAR and EMF exposure assessment, B. Derat is a renowned expert in numerical and experimental dosimetry. Since 2004, he has been continuously involved in the development of international SAR measurement standards as an active member of the IEC and IEEE SA. In 2010, Benoît founded ART-FI SAS with the aim to deliver innovative solutions for more efficient compliance demonstration to the wireless industry.