EMSCAN Presents, “EMC/EMI Testing in Less Than One Second Using Very-Near-Field Techniques”

 Click here to download a copy of the presentation.

Very-near-field measurements of radiated emissions are fast and easy to make and avoid the delays and set-up needed for far-field measurements in a chamber.

A distributed array of sensors for measuring the very-near-field can sit on your desktop and will allow EM and RF testing in less than one second!

Using this technique a designer can get an “emissions map” of a PCB or product in “real-time” and identify EMI and EMC problems early in the design cycle thus saving time and cost. This technique can also visualize the source of emissions that caused systems to fail compliance test and provide the insight required to fix the problem quickly. An 8 GHz scanning limit means it can be used for very high frequency boards where EMI and signal integrity (SI) problems often converge. Advanced applications like high resolution scanning, passive intermodulation testing, multi-frequency support, self-interference detection and absorber performance can also be undertaken by this near-field technique.

This seminar will show how the distributed array works and discuss using very-near-field measurements to solve emissions problems. Practical tips and a demonstration of an actual “real-time” EMxpert will be shown.

Who should attend:
Engineers or technicians who are facing EMI and EMC issues in a pre- and post-compliance environment. In depth knowledge or EMC principles is not required to get a benefit from this seminar.

Engineers attending this seminar can expect to learn:

– About the fastest method to capture very-near-field data
– How the very-near-field can be used to identify and debug EMC/EMI problems
– How the very-near-field can directly translate in pre-compliance level predictions

Ruska PattonRuska Patton
Ruska Patton, M.Sc. – Director of Product Management is responsible for the evolution of EMSCAN’s real-time near-field measurement solutions. He has a comprehensive understanding of general EMC, EMI and RF design and troubleshooting, with excellent skills in related software applications and programming.  Mr. Patton holds both a B.Sc. and M.Sc. in Electrical Engineering from the University of Saskatchewan. During his time at University, he was recognized with numerous IEEE awards and a distinguished research scholarship.